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Qing K. Zhu



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Qing K. Zhu


WSEAS Transactions on Circuits and Systems


Print ISSN: 1109-2734
E-ISSN: 2224-266X

Volume 18, 2019

Notice: As of 2014 and for the forthcoming years, the publication frequency/periodicity of WSEAS Journals is adapted to the 'continuously updated' model. What this means is that instead of being separated into issues, new papers will be added on a continuous basis, allowing a more regular flow and shorter publication times. The papers will appear in reverse order, therefore the most recent one will be on top.


Volume 18, 2019



Α New Methodology and CAD Programs to Detect Two Serious Faults in VLSI Design: HV/LV Connection Faults and Floating Gate Faults.

AUTHORS: Qing K. Zhu

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ABSTRACT: This paper presents the new methodology and CAD programs to detect two serious faults in VLSI design: HV/LV connection faults and floating gate faults. A hierarchical circuit netlist is flattened in order to trace the connectivity of MOS devices in hierarchically designed circuits. Programs were coded in Python and table-look up techniques were used to speed up the program run. Program flows and specification files are discussed. Specification file commands allowed designers to waive non-critical faults after reviewing them in the design. We developed GUI capability for highlighting nets in the schematic window. GUI helps designers review and fix faults in Cadence design environment. Programs and GUI capability have been applied in one industry project.

KEYWORDS: VLSI, Design, Multiple voltages, HV/LV, Floating gate, CAD, Tapeout.

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[15] “Inter-process communication SKILL functions reference”, https://read.pudn.com

WSEAS Transactions on Circuits and Systems, ISSN / E-ISSN: 1109-2734 / 2224-266X, Volume 18, 2019, Art. #33, pp. 220-235


Copyright © 2019 Author(s) retain the copyright of this article. This article is published under the terms of the Creative Commons Attribution License 4.0

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